
Surface Science Software
LEED , RHEED , Gun Controller, Auger / XPS, Labview, SEM/ SAM , Electron Gun Controllers, Virtual Surface Science workstation
Surface Science Software

Surface Science Software is a member site of Business Integration Software Ltd., (BIS), a company based in United Kingdom specializing in analysis tools for the surface science industry.
By close collaboration with both scientific instrument makers and surface scientists from top universities within Europe and the UK, our software addresses the real needs of today’s experimental. Our aim is to develop, produce,and provide innovative,high performance, and reliable state of the art software for surface analysis for research, development, and manufacturing.
The power of today’s personal computers, allowing features such as real-time collection and movie playback, has revolutionized the way in which experiments are done. Using these software it is possible to collect full image data without loss of quality, and recall it time and again for repeated analysis. This greatly reduces the time pressure on clean or process samples within the UHV environment and allows experiments (such as I(V) and (I)t using LEED and Oscillation and streak spacing analysis using RHEED) to be done at a later time.
Using an advanced configurable interface board, signals can be accepted both in analogue and digital form. Count rates up to 20Mc/s can be analysed per counter. Five channels are available for multi-channel analysis. Standard energy control is by a DAC output but other control systems can be considered. Features such as fast samples set up mode and a comprehensive data processing package provide an invaluable aid to the user.
We have a wide range of fully integrated multitasking analysis software for Windows XP and Windows Vista like RHEED, LEED, AUGER, Labview, Virtual Surface Science Workstation, Scanning Electron Microscope, X-ray photo electron spectroscopy, Scanning electron and AUGER microscopy, Electron Gun Controllers. For a fully comprehensive breakdown of our products, please contact us to see our products page For more information about our company and how we can help yours, start here.
We also welcome requests for quotes for any of our products. For instant quotes, contact us – sales@surfacesciencesoftware.com

Image/data aquisition and analysis. Fully integrated multitasking analysis software
Imaging:–
Real time Image display, single or multiple frames capture.
frame averaging and integration supported in all modes
dynamic adjustment of brightness and contrast
enhance by background subtraction and contrast stretching (linear or non- linear)
Images expoerted as standard bitmaps
capture movies to hard disks ( up to 10fps)
movies can be analysed later using all features of LEED express LEED imaging or LEED Office
Oscillations:-
Scillations, intensity and up to 18 spot positions
Play back oscillations through movie feature
spot tracking variable retention intensity
FFT power spectrum and Alternative grow rate calculation
Data saved as text file

Frame Grabbing:-
Works with any CCIR standard camera
On-camera integration option using USB and Firewire camera
Sync correction for VCRs
Wide range of black and white level adjustment
512X512 area from CCIR 768X576 frame
Area Scan from Digital Camera
Options:
Computer
CCIR Camera and Time integration module
Customised software
Digital 10,12 bit camera
Firewire camera
Streak Spacing
Live display of streak spacing
Play back streak spacing through movie feature
Peak fitting (Lorentzian, Gaussian and Voigt)
Smoothing
Spots and Profiles:
Multiple dynamic line profiles in any direciton
Real time line profiles
Manual or automatic spot and line management
Saturated spot diffusion
Profile smoothing and fitting

Operation Modes:
Normal operation
Stand by mode
Immediate stop
Digital Output Control:
Beam blanking (optional)
Auxiliary (optional)
RHEED/LEED gun controller:
Controls all relevant electron gun parameters
Various parameter sets can be saved and loaded
Integrates seamlessly into STAIB hardware
and RHEED Vision™ acquisition software
Analog channel control:
16 bit DAC control
Up to 8 analog outputs
Energy
Flament
Focus
Grid
Deflection X (optional)
Deflection Y (optional)
Rocking (optional)
Azimuth (optional)
Auger data acquisition and processing software. Ideal for the RFA, CMA and Hemispherical electron analyser applications.
Auger Data Acquisition:
Full user choice of acquisition parameters
Multiple scan
Up to 10 acquisition scans per experiment
Repetitive fast scan mode for sample set up
Target current monitoring
Analogue mode for LIA acquisition
Digital mode with 20Mc/s counter for pulse counting application
Automatic save of data
Multiple spectrum display for comparison
Context sensitive help
Auto Zoom and Expand facility
Direct energy mapping to DAC
Auto and manual re-scaling during run

Auger Data Processing:
Savitzky-Golay fitting analysis
Background subtraction options
Peak half width determination
Spectrum addition and subtraction
Smoothing options
Manual despike facility
Integration and differentiation
Full annotation
Full bitmap save facility for spectrum
Fast scan and peak detector:
Peak finder for a fixed energy
Pause and continuous scan facility
Real time oscilloscope trace with dynamic parameters

LEED Energy and Target Current:
Energy control 0-10V for 0eV to 1000eV(Programmable)
Target current and External input measurements
Intensity Vs Time I(t) Measurements:
Live display of time analysis
Playback I(t) measurements through movie feature
Smoothing
Options:
Computer
CCIR Camera and Time integration module
Customised software
Frame Grabbing:
Works with any CCIR standard camera
On-camera integration option using Cohu 4910 camera
Sync correction for VCRs
Wide range of black and white level adjustment
512X512 area from CCIR 768X576 frame
Image/data aquisition and analysis. Fully integrated multitasking analysis software
Imaging:
Real time image display, Single or multiple frames capture
Frame averaging and integration supported in all modes
Dynamic adjustment of brightness and contrast
Enhancement by background subtraction and contrast stretching (linear or non-linear)
Images exported as standard bitmaps
Capture movies to hard disk (up to 10fps)
Movies can be analysed later using all features of LEEDexpress, LEED Imaging or LEED Office
Intensity Vs Energy I(V) Measurements:
Real time display of intensity and up to 18 spot positions
Record I(V) movie, measurements through movie features
Spot tracking manual, automatic and Template with variable retention intensity
R-Factor Analysis for crystal alignment
Average I(V) spectra
Spots and Profiles:
Multiple dynamic line profiles in any direciton
Real time line profiles
Manual or automatic spot and line management
Saturated spot diffusion
Automatic calculation of spot size
Peak locking on spot and Auto default size of spot
Flexible modular experiment control using LABVIEW from National instruments.
We can provide solutions and a broad range of options including;
- Data collection
- Instrument control
- Power supply control
- Custom software for bespoke experimental set ups
- Updates for unsupported instruments
- Performance upgrades
- Added functionality
- Software interfacing for existing manual systems
- Multi-mode, macro style solutions for powerful experiment automation.
Save time on creating your experiment control: we will provide a fully supported solution for your needs. You benefit from a small team of experienced programmers already providing OEM solutions to scientific instrument manufacturers, combined with the backup of industry standard LABView (National Instruments). We can help you and talk you through the options; including providing a range of products from one ofs to OEM solutions.
From base function software enabling further user customization through to fully fledged packages with multiple data output forms, data processing and signal processing.

Multiple communication and interfacing options. We can provide connection and communication solutions using existing interfaces, replace obsolete interface, adding communication interfaces. We can link into existing software or provide new programs. The software and interfacing will enable spectrometer control, data collection of pulse or analogue signals, Lock-In Amplifier control, stage and sample motor control, motorised goniometer systems, e-beam, ion beam or photon source power supply control for optimum focusing and performance, thin film technique interfacing, LEED, RHEED, ISS, SEM and many more.
Increase productivity and unlock potential With multimode and integration style experiments, you can do for example depth profiling, angle resolved spectroscopy automated degassing and sample preparation, as well as quickly getting back to optimum repeatable experimental conditions. These features will improve your experimental accuracy and make good use of your precious experimental time.

SEM image processing:
Brightness
Contrast
Exported as bit map (.bmp)
Hardware:
Computer interface
All necessary cables
System upgrades:
XP
SAMSEM
gun controller
Data acquisition and processing surface science software
SEM image acquisition:
Full 32 bit image data
Dynamic scan display
Scanning speed adjustable for the
desired signal-to-noise ratio
64×64, 128×128, 256×256,
512×512, 1024×1024 display mode
Image input can be analog or digital
Load and save 32 bit facility
Auto dynamic range display
Adjustable gain
Operation modes:
Single image
Continuous mode
Accumulative mode
Fully integrated multitasking control software
Gun controller:
Controls all relevant electron gun parameters
Various parameter sets can be saved and loaded
Integrates seamlessly into STAIB hardware and acquisition software
Analog channel control:
16 bit DAC control
Up to 8 analog outputs

Digital output control:
Beam blanking (optional)
Auxiliary (optional)
Operation Modes:
Normal operation
Stand by mode
Immediate stop

A LabVIEW-based control system for a surface science experimental station.
We present a software package developed on the LabVIEW platform which controls a synchrotron radiation experimental station for surface science experiments and allows users efficient use of the equipment. In contrast to other programming environments, LabVIEW offers programmers an effective way of integrating the functions of several real instruments in a virtual instrument. By means of GPlB and serial communication our software controls most of the instruments attached to the experimental station. We developed programs (sub-virtual instruments) that allow interaction with the instruments by means of realistic-looking and -acting control virtual tools (knobs and buttons), which the user can ‘handle’ on the computer screen using the mouse. These ‘virtual panels’ allow simultaneous control of ail the devices involved in a specific experiment, performing sequences of operations in an automated way.