Surface Science Software

Surface Science Software
Surface Science Software

Surface Science Software  is a member site of Business Integration Software Ltd., (BIS), a company based in United Kingdom specializing in analysis tools for the surface science industry. 

By close collaboration with both scientific instrument makers and surface scientists from top universities within Europe and the UK, our software addresses the real needs of today’s experimental. Our aim is to develop, produce,and provide innovative,high performance, and reliable state of the art software for surface analysis for research, development, and manufacturing.

The power of today’s personal computers, allowing features such as real-time collection and movie playback, has revolutionized the way in which experiments are done. Using these software it is possible to collect full image data without loss of quality, and recall it time and again for repeated analysis. This greatly reduces the time pressure on clean or process samples within the UHV environment and allows experiments (such as I(V) and (I)t using LEED and Oscillation and streak spacing analysis using RHEED) to be done at a later time.

Using an advanced configurable interface board, signals can be accepted both in analogue and digital form. Count rates up to 20Mc/s can be analysed per counter. Five channels are available for multi-channel analysis. Standard energy control is by a DAC output but other control systems can be considered. Features such as fast samples set up mode and a comprehensive data processing package provide an invaluable aid to the user.

We have a wide range of fully integrated multitasking analysis software for Windows XP and Windows Vista like RHEED, LEED, AUGER, Labview, Virtual Surface Science Workstation, Scanning Electron Microscope, X-ray photo electron spectroscopy, Scanning electron and AUGER microscopy, Electron Gun Controllers. For a fully comprehensive breakdown of our products, please contact us to see our products page For more information about our company and how we can help yours, start here

We also welcome requests for quotes for any of our products. For instant quotes, contact us – sales@surfacesciencesoftware.com or our sales executive on – 
Phone: +44 (0) 20 8090 3452

Click here for more info

 

Surface Science Software for LEED, RHEED, SEM, SAM, Auger and Electron Gun Controller Software
Surface Science Software

Image/data aquisition and analysis. Fully integrated multitasking analysis software

Imaging:– 

Real time Image display, single or multiple frames capture.

frame averaging and integration supported in all modes

dynamic adjustment  of brightness and contrast

enhance by background subtraction and contrast stretching (linear or non- linear) 

Images expoerted as standard bitmaps

capture movies to hard disks ( up to 10fps) 

movies can be analysed later using all features of LEED express LEED imaging or LEED Office

Oscillations:- 

Scillations, intensity and up to 18 spot positions

Play back oscillations through movie feature

spot tracking variable retention intensity

FFT power spectrum and Alternative grow rate calculation

Data saved as text file

 

 

RHEED Software, RHEED Imaging Software, RHEED Data Acquisition Software

Frame Grabbing:-
Works with any CCIR standard camera
On-camera integration option using USB and Firewire camera
Sync correction for VCRs
Wide range of black and white level adjustment
512X512 area from CCIR 768X576 frame
Area Scan from Digital Camera 

Options:
Computer

CCIR Camera and Time integration module
Customised software
Digital 10,12 bit camera
Firewire camera

Streak Spacing
Live display of streak spacing

Play back streak spacing through movie feature
Peak fitting (Lorentzian, Gaussian and Voigt)
Smoothing

Spots and Profiles:

Multiple dynamic line profiles in any direciton
Real time line profiles
Manual or automatic spot and line management
Saturated spot diffusion
Profile smoothing and fitting

RHEED Gun Controller Software, LEED Gun Controller Software, Electron Gun Controller Software

Operation Modes:
Normal operation 
Stand by mode 
Immediate stop

Digital Output Control:
Beam blanking (optional) 
Auxiliary (optional)

RHEED/LEED gun controller:
Controls all relevant electron gun parameters 
Various parameter sets can be saved and loaded 
Integrates seamlessly into STAIB hardware
and RHEED Vision™ acquisition software

Analog channel control:
16 bit DAC control 
Up to 8 analog outputs 
Energy 
Flament 
Focus 
Grid 
Deflection X (optional) 
Deflection Y (optional) 
Rocking (optional) 
Azimuth (optional)

Auger data acquisition and processing software. Ideal for the RFA, CMA and Hemispherical electron analyser applications.

Auger Data Acquisition:
Full user choice of acquisition parameters

Multiple scan
Up to 10 acquisition scans per experiment
Repetitive fast scan mode for sample set up
Target current monitoring
Analogue mode for LIA acquisition
Digital mode with 20Mc/s counter for pulse counting application
Automatic save of data
Multiple spectrum display for comparison
Context sensitive help
Auto Zoom and Expand facility
Direct energy mapping to DAC
Auto and manual re-scaling during run

 

Auger Data Acquisition Software, Auger Data Analysis

Auger Data Processing:
Savitzky-Golay fitting analysis

Background subtraction options
Peak half width determination
Spectrum addition and subtraction
Smoothing options
Manual despike facility
Integration and differentiation
Full annotation
Full bitmap save facility for spectrum

Fast scan and peak detector:
Peak finder for a fixed energy
Pause and continuous scan facility
Real time oscilloscope trace with dynamic parameters

LEED Software, LEED Imaging Software, LEED Data Acquisition Software, LEED Spot Profile Software

LEED Energy and Target Current:
Energy control 0-10V for 0eV to 1000eV(Programmable)

Target current and External input measurements

Intensity Vs Time I(t) Measurements:
Live display of time analysis

Playback I(t) measurements through movie feature
Smoothing

Options:
Computer

CCIR Camera and Time integration module
Customised software

Frame Grabbing:
Works with any CCIR standard camera

On-camera integration option using Cohu 4910 camera
Sync correction for VCRs
Wide range of black and white level adjustment
512X512 area from CCIR 768X576 frame

Image/data aquisition and analysis. Fully integrated multitasking analysis software

Imaging:
Real time image display, Single or multiple frames capture

Frame averaging and integration supported in all modes
Dynamic adjustment of brightness and contrast
Enhancement by background subtraction and contrast stretching (linear or non-linear)
Images exported as standard bitmaps
Capture movies to hard disk (up to 10fps)
Movies can be analysed later using all features of LEEDexpress, LEED Imaging or LEED Office

Intensity Vs Energy I(V) Measurements:
Real time display of intensity and up to 18 spot positions

Record I(V) movie, measurements through movie features
Spot tracking manual, automatic and Template with variable retention intensity
R-Factor Analysis for crystal alignment
Average I(V) spectra

Spots and Profiles:
Multiple dynamic line profiles in any direciton
Real time line profiles
Manual or automatic spot and line management
Saturated spot diffusion
Automatic calculation of spot size
Peak locking on spot and Auto default size of spot

 

Flexible modular experiment control using LABVIEW from National instruments.

We can provide solutions and a broad range of options including;

  • Data collection
  • Instrument control
  • Power supply control
  • Custom software for bespoke experimental set ups
  • Updates for unsupported instruments
  • Performance upgrades
  • Added functionality
  • Software interfacing for existing manual systems
  • Multi-mode, macro style solutions for powerful experiment automation.

Save time on creating your experiment control: we will provide a fully supported solution for your needs. You benefit from a small team of experienced programmers already providing OEM solutions to scientific instrument manufacturers, combined with the backup of industry standard LABView (National Instruments). We can help you and talk you through the options; including providing a range of products from one ofs to OEM solutions. 

From base function software enabling further user customization through to fully fledged packages with multiple data output forms, data processing and signal processing.

 

Surface Science Software Labview

Multiple communication and interfacing options. We can provide connection and communication solutions using existing interfaces, replace obsolete interface, adding communication interfaces. We can link into existing software or provide new programs. The software and interfacing will enable spectrometer control, data collection of pulse or analogue signals, Lock-In Amplifier control, stage and sample motor control, motorised goniometer systems, e-beam, ion beam or photon source power supply control for optimum focusing and performance, thin film technique interfacing, LEED, RHEED, ISS, SEM and many more.

Increase productivity and unlock potential With multimode and integration style experiments, you can do for example depth profiling, angle resolved spectroscopy automated degassing and sample preparation, as well as quickly getting back to optimum repeatable experimental conditions. These features will improve your experimental accuracy and make good use of your precious experimental time.

Secondary Electronscopy Software, Secondary Auger Spectroscopy Software

SEM image processing: 
Brightness 

Contrast 
Exported as bit map (.bmp)

Hardware: 
Computer interface 
All necessary cables

System upgrades:
XP 
SAMSEM 
gun controller

Data acquisition and processing surface science software

SEM image acquisition: 
Full 32 bit image data 
Dynamic scan display 
Scanning speed adjustable for the 
desired signal-to-noise ratio 
64×64, 128×128, 256×256, 
512×512, 1024×1024 display mode 
Image input can be analog or digital 
Load and save 32 bit facility 
Auto dynamic range display 
Adjustable gain

Operation modes:
Single image 
Continuous mode 
Accumulative mode

 

Fully integrated multitasking control software

Gun controller: 
Controls all relevant electron gun parameters
Various parameter sets can be saved and loaded
Integrates seamlessly into STAIB hardware and acquisition software

Analog channel control: 
16 bit DAC control 

Up to 8 analog outputs

 

Electron Gun Controller Software for range of electron guns

Digital output control:
Beam blanking (optional) 

Auxiliary (optional)

Operation Modes:
Normal operation 
Stand by mode 
Immediate stop

Virtual Surface Science Software Workstation

A LabVIEW-based control system for a surface science experimental station.

We present a software package developed on the LabVIEW platform which controls a synchrotron radiation experimental station for surface science experiments and allows users efficient use of the equipment. In contrast to other programming environments, LabVIEW offers programmers an effective way of integrating the functions of several real instruments in a virtual instrument. By means of GPlB and serial communication our software controls most of the instruments attached to the experimental station. We developed programs (sub-virtual instruments) that allow interaction with the instruments by means of realistic-looking and -acting control virtual tools (knobs and buttons), which the user can ‘handle’ on the computer screen using the mouse. These ‘virtual panels’ allow simultaneous control of ail the devices involved in a specific experiment, performing sequences of operations in an automated way.

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